In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

摘要

In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.